The Physics of Si: O2 and its Interfaces. Proceedings of...

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The Physics of Si: O2 and its...

The Physics of Si: O2 and its Interfaces. Proceedings of the International Topical Conference on the Physics of Si: O2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22–24, 1978

Sokrates T. Pantelides (Eds.)

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როგორ მოგეწონათ ეს წიგნი?

როგორი ხარისხისაა ეს ფაილი?

ჩატვირთეთ, ხარისხის შესაფასებლად

როგორი ხარისხისაა ჩატვირთული ფაილი?

კატეგორია:

Science (General)

წელი:

1978

გამომცემლობა:

Pergamon Press

ენა:

english

გვერდები:

493

ISBN 10:

0080230490

ISBN 13:

9780080230498

ფაილი:

PDF, 13.97 MB

IPFS:

,

english, 1978

ონლაინ წაკითხვა

ჩატვირთვა (pdf, 13.97 MB)

ხორციელდება კონვერტაციის -ში

კონვერტაციის -ში ვერ მოხერხდა

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